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Degradation in InAlN/AlN/GaN heterostructure field-effect t..:

Kayis, C ; Ferreyra, Romualdo Alejandro ; Wu, M...
info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/full/10.1063/1.3624702.  ,
Link: http://hdl.handle.net/11336/66392