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Terahertz optical thickness and birefringence measurement f..:
Waddie, Andrew J
;
Schemmel, Peter J
;
Chalk, Christine
...
Waddie AJ, Schemmel PJ, Chalk C, et al., (2020) Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location. Optics Express, Volume 28, Issue 21, 2020, pp. 31535-31552. , 2020
Link:
https://doi.org/10.1364/OE.398532
RT Journal T1 <Title>Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftcranfield:oai:dspace.lib.cranfield.ac.uk:1826_15867&Exemplar=1&LAN=DE A1 Waddie, Andrew J A1 Schemmel, Peter J A1 Chalk, Christine A1 Isern, Luis A1 Nicholls, John R A1 Moore, Andrew J PB Optical Society of America YR 2020 K1 Thermal barrier coating K1 Bifringence measurement JF Waddie AJ, Schemmel PJ, Chalk C, et al., (2020) Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location. Optics Express, Volume 28, Issue 21, 2020, pp. 31535-31552 LK http://dx.doi.org/https://doi.org/10.1364/OE.398532 DO https://doi.org/10.1364/OE.398532 SF ELIB - SuUB Bremen
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