Titel

Merkliste
1 Ergebnisse

Supplementary Notes - Defect engineering of silicon with io..:

Redjem, Walid ; Amsellem, Ariel J ; Allen, Frances I...
Redjem, Walid; Amsellem, Ariel J.; Allen, Frances I.; Benndorf, Gabriele; Bin, Jianhui; Bulanov, Stepan; Esarey, Eric; Feldman, Leonard C.; Ferrer Fernández, Javier; García López, J.; Geulig, Laura; Geddes, Cameron R.; Hijazi, Hussein; Ji, Qing; Ivanov, Vsevolod; Kanté, Boubacar; Gonsalves, Anthony; Meijer, Jan; Nakamura, Kei; Persaud, Arun; Pong, Ian; Obst-Huebl, Lieselotte; Seidl, Peter A.; Simoni, Jacopo; Schroeder, Carl; Steinke, Sven; Tan, Liang Z.; Wunderlich, Ralf; Wynne, Brian; Schenkel, Thomas. Defect engineering of silicon with ion pulses from laser acceleration. https://doi.org/10.1038/s43246-023-00349-4. http://hdl.handle.net/10261/340687. , 2023

Link: http://hdl.handle.net/10261/340701

RT Journal
T1 <Title>Supplementary Notes - Defect engineering of silicon with ion pulses from laser acceleration</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftcsic:oai:digital.csic.es:10261_340701&Exemplar=1&LAN=DE
				
A1 Redjem, Walid
A1 Amsellem, Ariel J
A1 Allen, Frances I
A1 Benndorf, Gabriele
A1 Bin, Jianhui
A1 Bulanov, Stepan
A1 Esarey, Eric
A1 Feldman, Leonard C
A1 Ferrer Fernández, Javier
A1 García López, J
A1 Geulig, Laura
A1 Geddes, Cameron R
A1 Hijazi, Hussein
A1 Ji, Qing
A1 Ivanov, Vsevolod
A1 Kanté, Boubacar
A1 Gonsalves, Anthony
A1 Meijer, Jan
A1 Nakamura, Kei
A1 Persaud, Arun
A1 Pong, Ian
A1 Obst-Huebl, Lieselotte
A1 Seidl, Peter A
A1 Simoni, Jacopo
A1 Schroeder, Carl
A1 Steinke, Sven
A1 Tan, Liang Z
A1 Wunderlich, Ralf
A1 Wynne, Brian
A1 Schenkel, Thomas
PB Nature Publishing Group
YR 2023
JF Redjem, Walid; Amsellem, Ariel J.; Allen, Frances I.; Benndorf, Gabriele; Bin, Jianhui; Bulanov, Stepan; Esarey, Eric; Feldman, Leonard C.; Ferrer Fernández, Javier; García López, J.; Geulig, Laura; Geddes, Cameron R.; Hijazi, Hussein; Ji, Qing; Ivanov, Vsevolod; Kanté, Boubacar; Gonsalves, Anthony; Meijer, Jan; Nakamura, Kei; Persaud, Arun; Pong, Ian; Obst-Huebl, Lieselotte; Seidl, Peter A.; Simoni, Jacopo; Schroeder, Carl; Steinke, Sven; Tan, Liang Z.; Wunderlich, Ralf; Wynne, Brian; Schenkel, Thomas. Defect engineering of silicon with ion pulses from laser acceleration. https://doi.org/10.1038/s43246-023-00349-4. http://hdl.handle.net/10261/340687
LK http://hdl.handle.net/10261/340701
DO http://hdl.handle.net/10261/340701
SF ELIB - SuUB Bremen

Export

RefWorks (nur Desktop-Version!)
Flow (Zuerst in Flow einloggen, dann importieren)