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1 Ergebnisse
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Transmission Electron Microscopy Peeled Surface Defect of P..:
Longfei Yuan
;
Taixin Zhou
;
Fengmin Jin
...
https://www.mdpi.com/1996-1944/16/17/6010. , 2023
Link:
https://doi.org/10.3390/ma16176010
RT Journal T1
Transmission Electron Microscopy Peeled Surface Defect of Perovskite Quantum Dots to Improve Crystal Structure
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:004065317fbf42089ae9a7ee3b0f33c1&Exemplar=1&LAN=DE A1 Longfei Yuan A1 Taixin Zhou A1 Fengmin Jin A1 Guohong Liang A1 Yuxiang Liao A1 Aijuan Zhao A1 Wenbo Yan PB MDPI AG YR 2023 K1 transmission electron microscopy K1 perovskite quantum dots K1 [PbBr 6 ] 4− octahedron K1 defect K1 Technology K1 T K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 K1 Engineering (General). Civil engineering (General) K1 TA1-2040 K1 Microscopy K1 QH201-278.5 K1 Descriptive and experimental mechanics K1 QC120-168.85 JF https://www.mdpi.com/1996-1944/16/17/6010 LK http://dx.doi.org/https://doi.org/10.3390/ma16176010 DO https://doi.org/10.3390/ma16176010 SF ELIB - SuUB Bremen
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