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1 Ergebnisse
1
Multiple Controlled Antirandom Testing (MCAT) for High Faul..:
Arbab Alamgir
;
Abu Khari Bin A'Ain
;
Usman Ullah Sheikh
...
https://ieeexplore.ieee.org/document/8811467/. , 2019
Link:
https://doi.org/10.1109/ACCESS.2019.2937113
RT Journal T1
Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:0c1af1d215464f9787081151b0fc55b1&Exemplar=1&LAN=DE A1 Arbab Alamgir A1 Abu Khari Bin A'Ain A1 Usman Ullah Sheikh A1 Norlina Paraman A1 Musa Mohd Mokji A1 Ian Grout PB IEEE YR 2019 K1 Antirandom K1 test pattern generation K1 computation reduction K1 multiple controlled antirandom tests K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/8811467/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2019.2937113 DO https://doi.org/10.1109/ACCESS.2019.2937113 SF ELIB - SuUB Bremen
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