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1 Ergebnisse
1
Methodology for Testing Key Parameters of Array-Level Small..:
Donglin Zhang
;
Honghu Yang
;
Yue Cao
...
https://www.mdpi.com/2072-666X/14/10/1851. , 2023
Link:
https://doi.org/10.3390/mi14101851
RT Journal T1
Methodology for Testing Key Parameters of Array-Level Small-Area Hafnium-Based Ferroelectric Capacitors Using Time-to-Digital Converter and Capacitance Calibration Circuits
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:0c37c7a64f714ae69d9d2de1b3408e64&Exemplar=1&LAN=DE A1 Donglin Zhang A1 Honghu Yang A1 Yue Cao A1 Zhongze Han A1 Yixuan Liu A1 Qiqiao Wu A1 Yongkang Han A1 Haijun Jiang A1 Jianguo Yang PB MDPI AG YR 2023 K1 ferroelectric capacitor K1 hafnium K1 test methodology K1 small area K1 array K1 non-ideal effect K1 Mechanical engineering and machinery K1 TJ1-1570 JF https://www.mdpi.com/2072-666X/14/10/1851 LK http://dx.doi.org/https://doi.org/10.3390/mi14101851 DO https://doi.org/10.3390/mi14101851 SF ELIB - SuUB Bremen
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