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1 Ergebnisse
1
Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Ch..:
Hyunseo You
;
Kihoon Nam
;
Jehyun An
...
https://ieeexplore.ieee.org/document/10398173/. , 2024
Link:
https://doi.org/10.1109/ACCESS.2024.3353227
RT Journal T1
Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Channel-Array Transistor for Quantum Computing Applications
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:0d98260d7f88492fb8965b2bee05a9ea&Exemplar=1&LAN=DE A1 Hyunseo You A1 Kihoon Nam A1 Jehyun An A1 Chanyang Park A1 Donghyun Kim A1 Seonhaeng Lee A1 Namhyun Lee A1 Rock-Hyun Baek PB IEEE YR 2024 K1 Buried-channel-array transistor (BCAT) K1 cryogenic K1 drain-induced barrier lowering (DIBL) K1 forward body bias K1 hot-carrier degradation K1 threshold voltage K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10398173/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2024.3353227 DO https://doi.org/10.1109/ACCESS.2024.3353227 SF ELIB - SuUB Bremen
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