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1 Ergebnisse
1
Experimental investigation on the single event gate rupture..:
Zhichao Wei
;
Hongwei Zhang
;
Yi Sun
...
http://dx.doi.org/10.1063/5.0021453. , 2021
Link:
https://doi.org/10.1063/5.0021453
RT Journal T1
Experimental investigation on the single event gate rupture and hardening of the 600 V trench IGBT
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:0de3a7b264884c35ad3ffe0fe14e45f8&Exemplar=1&LAN=DE A1 Zhichao Wei A1 Hongwei Zhang A1 Yi Sun A1 Wangran Wu A1 Lei Luo A1 Qingkui Yu A1 Min Tang PB AIP Publishing LLC YR 2021 K1 Physics K1 QC1-999 JF http://dx.doi.org/10.1063/5.0021453 LK http://dx.doi.org/https://doi.org/10.1063/5.0021453 DO https://doi.org/10.1063/5.0021453 SF ELIB - SuUB Bremen
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