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1 Ergebnisse
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Characterization of single event effect simulation in InP-b..:
Shuxiang Sun
;
Linshuang Liu
;
Haitao Wu
...
http://www.sciencedirect.com/science/article/pii/S2211379722002182. , 2022
Link:
https://doi.org/10.1016/j.rinp.2022.105467
RT Journal T1 <Title>Characterization of single event effect simulation in InP-based High Electron Mobility Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:103d8a3462c547edab0083f79c18036b&Exemplar=1&LAN=DE A1 Shuxiang Sun A1 Linshuang Liu A1 Haitao Wu A1 Ruxian Yao A1 Hongying Mei A1 Hua Wen A1 Yinghui Zhong PB Elsevier YR 2022 K1 InP based HEMT K1 SEE K1 LET K1 Drain voltage K1 Physics K1 QC1-999 JF http://www.sciencedirect.com/science/article/pii/S2211379722002182 LK http://dx.doi.org/https://doi.org/10.1016/j.rinp.2022.105467 DO https://doi.org/10.1016/j.rinp.2022.105467 SF ELIB - SuUB Bremen
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