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Study of reactive electron beam deposited tantalum penta ox..:
R.B. Tokas
;
S. Jena
;
C. Prathap
...
http://www.sciencedirect.com/science/article/pii/S2666523923001149. , 2023
Link:
https://doi.org/10.1016/j.apsadv.2023.100480
RT Journal T1 <Title>Study of reactive electron beam deposited tantalum penta oxide thin films with spectroscopic ellipsometry and atomic force microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:1729ce6c6f5248f9ae10c062673f17db&Exemplar=1&LAN=DE A1 R.B. Tokas A1 S. Jena A1 C. Prathap A1 S. Thakur A1 K. Divakar Rao A1 D.V. Udupa PB Elsevier YR 2023 K1 Tantalum penta oxide thin films K1 Electron beam deposition K1 Spectroscopic ellipsometry K1 Atomic force microscopy K1 Grazing incidence X-ray reflectivity K1 Materials of engineering and construction. Mechanics of materials K1 TA401-492 K1 Industrial electrochemistry K1 TP250-261 JF http://www.sciencedirect.com/science/article/pii/S2666523923001149 LK http://dx.doi.org/https://doi.org/10.1016/j.apsadv.2023.100480 DO https://doi.org/10.1016/j.apsadv.2023.100480 SF ELIB - SuUB Bremen
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