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Analysis of Hot Carrier Degradation in 0.25-μm Schottky Gat..:
Seong-In Cho
;
Won-Ho Jang
;
Ho-Young Cha
.
http://jees.kr/upload/pdf/jees-2022-3-r-89.pdf. , 2022
Link:
https://doi.org/10.26866/jees.2022.3.r.89
RT Journal T1
Analysis of Hot Carrier Degradation in 0.25-μm Schottky Gate AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:22e6468f564e414d97ed8f361d151ec5&Exemplar=1&LAN=DE A1 Seong-In Cho A1 Won-Ho Jang A1 Ho-Young Cha A1 Hyungtak Kim PB The Korean Institute of Electromagnetic Engineering and Science YR 2022 K1 algan/gan hemt K1 degradation K1 hot carrier effect K1 reliability K1 trap K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 K1 Electricity and magnetism K1 QC501-766 JF http://jees.kr/upload/pdf/jees-2022-3-r-89.pdf LK http://dx.doi.org/https://doi.org/10.26866/jees.2022.3.r.89 DO https://doi.org/10.26866/jees.2022.3.r.89 SF ELIB - SuUB Bremen
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