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Measurement of Thermal Stress by X-ray Nano-Diffraction in ..:
Wei-You Hsu
;
Shih-Chi Yang
;
You-Yi Lin
...
https://www.mdpi.com/2079-4991/13/17/2448. , 2023
Link:
https://doi.org/10.3390/nano13172448
RT Journal T1
Measurement of Thermal Stress by X-ray Nano-Diffraction in (111)-Oriented Nanotwinned Cu Bumps for Cu/SiO 2 Hybrid Joints
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:29123c55454c49d8833f2e1aa2e5d138&Exemplar=1&LAN=DE A1 Wei-You Hsu A1 Shih-Chi Yang A1 You-Yi Lin A1 Wan-Zhen Hsieh A1 King-Ning Tu A1 Wei-Lan Chiu A1 Hsiang-Hung Chang A1 Ching-Yu Chiang A1 Chih Chen PB MDPI AG YR 2023 K1 synchrotron radiation K1 X-ray nanodiffraction K1 thermal strain distribution K1 Cu/SiO 2 hybrid bonding K1 nanotwinned Cu K1 Chemistry K1 QD1-999 JF https://www.mdpi.com/2079-4991/13/17/2448 LK http://dx.doi.org/https://doi.org/10.3390/nano13172448 DO https://doi.org/10.3390/nano13172448 SF ELIB - SuUB Bremen
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