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1 Ergebnisse
1
Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked H..:
Chii-Wen Chen
;
Mu-Chun Wang
;
Cheng-Hsun-Tony Chang
...
https://www.mdpi.com/2079-9292/9/12/2095. , 2020
Link:
https://doi.org/10.3390/electronics9122095
RT Journal T1
Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:2cacaf2a62014eb59090b4c6eac5d60f&Exemplar=1&LAN=DE A1 Chii-Wen Chen A1 Mu-Chun Wang A1 Cheng-Hsun-Tony Chang A1 Wei-Lun Chu A1 Shun-Ping Sung A1 Wen-How Lan PB MDPI AG YR 2020 K1 drain current K1 hot-carrier K1 impact ionization K1 high-k K1 lifetime K1 substrate current K1 Electronics K1 TK7800-8360 JF https://www.mdpi.com/2079-9292/9/12/2095 LK http://dx.doi.org/https://doi.org/10.3390/electronics9122095 DO https://doi.org/10.3390/electronics9122095 SF ELIB - SuUB Bremen
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