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1 Ergebnisse
1
Characterization and Modeling I(V) of the Gate Schottky Str..:
N. Benyahya
;
H. Mazari
;
N. Benseddik
...
http://www.sensorsportal.com/HTML/DIGEST/may_2014/Special_issue/P_SI_482.pdf. , 2014
Link:
https://doaj.org/article/38dbf27b5561487cb66c96030d341..
RT Journal T1
Characterization and Modeling I(V) of the Gate Schottky Structures HEMTs Ni/Au/AlInN/GaN
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:38dbf27b5561487cb66c96030d34175e&Exemplar=1&LAN=DE A1 N. Benyahya A1 H. Mazari A1 N. Benseddik A1 Z. Benamara A1 M. Mostefaoui A1 K. Ameur A1 J. M. Bluet A1 W. Chikhaoui A1 C. Bru-Chevallier PB IFSA Publishing, S.L. YR 2014 K1 GaN K1 AlInN K1 Electrical characterization K1 HEMT transistor K1 Technology (General) K1 T1-995 JF http://www.sensorsportal.com/HTML/DIGEST/may_2014/Special_issue/P_SI_482.pdf LK http://dx.doi.org/https://doaj.org/article/38dbf27b5561487cb66c96030d34175e DO https://doaj.org/article/38dbf27b5561487cb66c96030d34175e SF ELIB - SuUB Bremen
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