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1 Ergebnisse
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Determination of failure degree of 1.2 kV SiC MOSFETs after..:
Shen Diao
;
Jun Sun
;
Ziwei Zhou
...
http://www.sciencedirect.com/science/article/pii/S2589554020300404. , 2020
Link:
https://doi.org/10.1016/j.npe.2020.12.002
RT Journal T1 <Title>Determination of failure degree of 1.2 kV SiC MOSFETs after short-circuit test using an improved test setup</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:430c070a408a43e5b579807c8c3e73c7&Exemplar=1&LAN=DE A1 Shen Diao A1 Jun Sun A1 Ziwei Zhou A1 Zhenzhong Zhang A1 Adolf Schöner A1 Zedong Zheng A1 Weiwei He PB AIP Publishing LLC YR 2020 K1 SiC MOSFET K1 Short-circuit test K1 Failure analysis K1 Technology K1 T K1 Engineering (General). Civil engineering (General) K1 TA1-2040 JF http://www.sciencedirect.com/science/article/pii/S2589554020300404 LK http://dx.doi.org/https://doi.org/10.1016/j.npe.2020.12.002 DO https://doi.org/10.1016/j.npe.2020.12.002 SF ELIB - SuUB Bremen
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