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1 Ergebnisse
1
Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devi..:
Nicolò D'Anna
;
Dario Ferreira Sanchez
;
Guy Matmon
...
https://doi.org/10.1002/aelm.202201212. , 2023
Link:
https://doi.org/10.1002/aelm.202201212
RT Journal T1
Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:4c5c4e033fa84dad9f3b4d2c476d593f&Exemplar=1&LAN=DE A1 Nicolò D'Anna A1 Dario Ferreira Sanchez A1 Guy Matmon A1 Jamie Bragg A1 Procopios C. Constantinou A1 Taylor J.Z. Stock A1 Sarah Fearn A1 Steven R. Schofield A1 Neil J. Curson A1 Marek Bartkowiak A1 Y. Soh A1 Daniel Grolimund A1 Simon Gerber A1 Gabriel Aeppli PB Wiley-VCH YR 2023 K1 doped silicon devices K1 non‐destructive sub‐surface imaging K1 X‐ray fluorescence K1 Electric apparatus and materials. Electric circuits. Electric networks K1 TK452-454.4 K1 Physics K1 QC1-999 JF https://doi.org/10.1002/aelm.202201212 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202201212 DO https://doi.org/10.1002/aelm.202201212 SF ELIB - SuUB Bremen
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