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1 Ergebnisse
1
Improving electrical performance and bias stability of HfIn..:
Jun Li
;
Xing-Wei Ding
;
Jian-Hua Zhang
...
http://dx.doi.org/10.1063/1.4828674. , 2013
Link:
https://doi.org/10.1063/1.4828674
RT Journal T1
Improving electrical performance and bias stability of HfInZnO-TFT with optimizing the channel thickness
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:4f7787713ad6493488ed309a6fcfb58f&Exemplar=1&LAN=DE A1 Jun Li A1 Xing-Wei Ding A1 Jian-Hua Zhang A1 Hao Zhang A1 Xue-Yin Jiang A1 Zhi-Lin Zhang PB AIP Publishing LLC YR 2013 K1 Physics K1 QC1-999 JF http://dx.doi.org/10.1063/1.4828674 LK http://dx.doi.org/https://doi.org/10.1063/1.4828674 DO https://doi.org/10.1063/1.4828674 SF ELIB - SuUB Bremen
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