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1 Ergebnisse
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Application of UV photoluminescence imaging spectroscopy fo..:
N. Thierry-Jebali
;
C. Kawahara
;
T. Miyazawa
..
http://dx.doi.org/10.1063/1.4915128. , 2015
Link:
https://doi.org/10.1063/1.4915128
RT Journal T1
Application of UV photoluminescence imaging spectroscopy for stacking faults identification on thick, lightly n-type doped, 4°-off 4H-SiC epilayers
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:53aa8873ed834ca384080bc1541f2e47&Exemplar=1&LAN=DE A1 N. Thierry-Jebali A1 C. Kawahara A1 T. Miyazawa A1 H. Tsuchida A1 T. Kimoto PB AIP Publishing LLC YR 2015 K1 Physics K1 QC1-999 JF http://dx.doi.org/10.1063/1.4915128 LK http://dx.doi.org/https://doi.org/10.1063/1.4915128 DO https://doi.org/10.1063/1.4915128 SF ELIB - SuUB Bremen
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