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1 Ergebnisse
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Reliable strain measurement in transistor arrays by robust ..:
Suhyun Kim
;
Joong Jung Kim
;
Younheum Jung
...
http://dx.doi.org/10.1063/1.4821278. , 2013
Link:
https://doi.org/10.1063/1.4821278
RT Journal T1
Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:555ed5df5bed44b7a48096a682eefbb9&Exemplar=1&LAN=DE A1 Suhyun Kim A1 Joong Jung Kim A1 Younheum Jung A1 Kyungwoo Lee A1 Gwangsun Byun A1 KyoungHwan Hwang A1 Sunyoung Lee A1 Kyupil Lee PB AIP Publishing LLC YR 2013 K1 Physics K1 QC1-999 JF http://dx.doi.org/10.1063/1.4821278 LK http://dx.doi.org/https://doi.org/10.1063/1.4821278 DO https://doi.org/10.1063/1.4821278 SF ELIB - SuUB Bremen
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