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1 Ergebnisse
1
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Rad..:
Chang Cai
;
Xue Fan
;
Jie Liu
...
http://www.mdpi.com/2079-9292/8/3/323. , 2019
Link:
https://doi.org/10.3390/electronics8030323
RT Journal T1
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:5698c36ae9f2431f940b85454311f80b&Exemplar=1&LAN=DE A1 Chang Cai A1 Xue Fan A1 Jie Liu A1 Dongqing Li A1 Tianqi Liu A1 Lingyun Ke A1 Peixiong Zhao A1 Ze He PB MDPI AG YR 2019 K1 FPGA K1 radiation hardening K1 single event upsets K1 heavy ions K1 error rates K1 Electronics K1 TK7800-8360 JF http://www.mdpi.com/2079-9292/8/3/323 LK http://dx.doi.org/https://doi.org/10.3390/electronics8030323 DO https://doi.org/10.3390/electronics8030323 SF ELIB - SuUB Bremen
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