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A Secure JTAG Wrapper for SoC Testing and Debugging:
Kuen-Jong Lee
;
Zheng-Yao Lu
;
Shih-Chun Yeh
https://ieeexplore.ieee.org/document/9749066/. , 2022
Link:
https://doi.org/10.1109/ACCESS.2022.3164712
RT Journal T1
A Secure JTAG Wrapper for SoC Testing and Debugging
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:5dfccd6a3679468985da674a6785df8d&Exemplar=1&LAN=DE A1 Kuen-Jong Lee A1 Zheng-Yao Lu A1 Shih-Chun Yeh PB IEEE YR 2022 K1 Hardware security K1 IEEE test standard security K1 JTAG security K1 memory attack K1 secure JTAG wrapper K1 physical unclonable function (PUF) K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/9749066/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2022.3164712 DO https://doi.org/10.1109/ACCESS.2022.3164712 SF ELIB - SuUB Bremen
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