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1 Ergebnisse
1
Design and Evaluation of High-Speed Overcurrent and Short-C..:
Hae-Chan Park
;
Myeong-Jun Cha
;
Seon-Ho Jeon
.
https://ieeexplore.ieee.org/document/10385085/. , 2024
Link:
https://doi.org/10.1109/ACCESS.2024.3351744
RT Journal T1
Design and Evaluation of High-Speed Overcurrent and Short-Circuit Detection Circuits With High Noise Margin for WBG Power Semiconductor Devices
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:5ef7d0c3da7e402393b7ba4cb6c12e2d&Exemplar=1&LAN=DE A1 Hae-Chan Park A1 Myeong-Jun Cha A1 Seon-Ho Jeon A1 Rae-Young Kim PB IEEE YR 2024 K1 Wide bandgap (WBG) K1 device under test (DUT) K1 SiC MOSFETs K1 GaN HEMTs K1 double pulse test (DPT) K1 fault under load (FUL) K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10385085/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2024.3351744 DO https://doi.org/10.1109/ACCESS.2024.3351744 SF ELIB - SuUB Bremen
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