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1 Ergebnisse
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Disturbance auto-encoder generation model: Few-shot learnin..:
Fan Wu
;
Gen Qiu
;
Lefei Zhang
...
https://www.frontiersin.org/articles/10.3389/fenrg.2022.1077519/full. , 2023
Link:
https://doi.org/10.3389/fenrg.2022.1077519
RT Journal T1 <Title>Disturbance auto-encoder generation model: Few-shot learning method for IGBT open-circuit fault diagnosis in three-phase converters</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:6826930b067c42e893bde67fdb7d5f97&Exemplar=1&LAN=DE A1 Fan Wu A1 Gen Qiu A1 Lefei Zhang A1 Kai Chen A1 Li Wang A1 Jinxu Yu A1 Jinqi Gao PB Frontiers Media S.A. YR 2023 K1 IGBT open-circuit fault K1 data augmentation K1 generation model K1 auto-encoder K1 few-shot learning K1 General Works K1 A JF https://www.frontiersin.org/articles/10.3389/fenrg.2022.1077519/full LK http://dx.doi.org/https://doi.org/10.3389/fenrg.2022.1077519 DO https://doi.org/10.3389/fenrg.2022.1077519 SF ELIB - SuUB Bremen
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