I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A non-destructive channel stress characterization for gate-..:
Huang Ziqiang
;
Liu Tao
;
Yang Jingwen
...
https://www.sciengine.com/doi/10.1360/nso/20220027. , 2022
Link:
https://doi.org/10.1360/nso/20220027
RT Journal T1
A non-destructive channel stress characterization for gate-all-around nanosheet transistors by confocal Raman methodology
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:695eeb28d6104fa3981118683a0c6b80&Exemplar=1&LAN=DE A1 Huang Ziqiang A1 Liu Tao A1 Yang Jingwen A1 Sun Xin A1 Chen Kun A1 Wang Dawei A1 Hu Hailong A1 Xu Min A1 Wang Chen A1 Xu Saisheng A1 Zhang David Wei PB Science Press YR 2022 K1 non-destructive characterization K1 channel stress K1 gate all around (GAA) K1 confocal Raman K1 Science K1 Q K1 Engineering (General). Civil engineering (General) K1 TA1-2040 JF https://www.sciengine.com/doi/10.1360/nso/20220027 LK http://dx.doi.org/https://doi.org/10.1360/nso/20220027 DO https://doi.org/10.1360/nso/20220027 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)