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Physical and Electrical Analysis of Poly-Si Channel Effect ..:
Jun-Kyo Jeong
;
Jae-Young Sung
;
Woon-San Ko
...
https://www.mdpi.com/2072-666X/12/11/1401. , 2021
Link:
https://doi.org/10.3390/mi12111401
RT Journal T1
Physical and Electrical Analysis of Poly-Si Channel Effect on SONOS Flash Memory
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:6f43c6382e7747d8b6ace45c84bd2542&Exemplar=1&LAN=DE A1 Jun-Kyo Jeong A1 Jae-Young Sung A1 Woon-San Ko A1 Ki-Ryung Nam A1 Hi-Deok Lee A1 Ga-Won Lee PB MDPI AG YR 2021 K1 SONOS K1 flash memory K1 poly silicon K1 roughness K1 data retention K1 atomic force microscope (AFM) K1 Mechanical engineering and machinery K1 TJ1-1570 JF https://www.mdpi.com/2072-666X/12/11/1401 LK http://dx.doi.org/https://doi.org/10.3390/mi12111401 DO https://doi.org/10.3390/mi12111401 SF ELIB - SuUB Bremen
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