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1 Ergebnisse
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Understanding the Leakage Mechanisms and Breakdown Limits o..:
Kalparupa Mukherjee
;
Carlo De Santi
;
Matteo Buffolo
...
https://www.mdpi.com/2072-666X/12/4/445. , 2021
Link:
https://doi.org/10.3390/mi12040445
RT Journal T1
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p + n − n Diodes: The Road to Reliable Vertical MOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:750e956e6aa847fd82068bdb34450216&Exemplar=1&LAN=DE A1 Kalparupa Mukherjee A1 Carlo De Santi A1 Matteo Buffolo A1 Matteo Borga A1 Shuzhen You A1 Karen Geens A1 Benoit Bakeroot A1 Stefaan Decoutere A1 Andrea Gerosa A1 Gaudenzio Meneghesso A1 Enrico Zanoni A1 Matteo Meneghini PB MDPI AG YR 2021 K1 semi-vertical K1 vertical K1 GaN K1 pn diodes K1 leakage modeling K1 device modeling K1 Mechanical engineering and machinery K1 TJ1-1570 JF https://www.mdpi.com/2072-666X/12/4/445 LK http://dx.doi.org/https://doi.org/10.3390/mi12040445 DO https://doi.org/10.3390/mi12040445 SF ELIB - SuUB Bremen
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