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Structural Characterization of ZnTe Grown by Atomic-Layer-D..:
Roberto Saúl Castillo-Ojeda
;
Joel Díaz-Reyes
;
Miguel Galván-Arellano
...
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000501179&tlng=en. , 2017
Link:
https://doi.org/10.1590/1980-5373-mr-2016-0181
RT Journal T1
Structural Characterization of ZnTe Grown by Atomic-Layer-Deposition Regime on GaAs and GaSb (100) Oriented Substrates
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:75726ec5971d4a7086b05a56e1206de0&Exemplar=1&LAN=DE A1 Roberto Saúl Castillo-Ojeda A1 Joel Díaz-Reyes A1 Miguel Galván-Arellano A1 Francisco de Anda-Salazar A1 Jorge Indalecio Contreras-Rascon A1 María de la Cruz Peralta-Clara A1 Julieta Salomé Veloz-Rendón PB Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol) YR 2017 K1 Atomic Layer Deposition K1 nanolayers K1 X-ray diffraction K1 Raman scattering K1 Materials of engineering and construction. Mechanics of materials K1 TA401-492 JF http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000501179&tlng=en LK http://dx.doi.org/https://doi.org/10.1590/1980-5373-mr-2016-0181 DO https://doi.org/10.1590/1980-5373-mr-2016-0181 SF ELIB - SuUB Bremen
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