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1 Ergebnisse
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Review on the degradation of GaN-based lateral power transi..:
C. De Santi
;
M. Buffolo
;
I. Rossetto
...
http://www.sciencedirect.com/science/article/pii/S2772671121000176. , 2021
Link:
https://doi.org/10.1016/j.prime.2021.100018
RT Journal T1 <Title>Review on the degradation of GaN-based lateral power transistors</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:78df0b8f79f44b6cb96de56f0a33eabf&Exemplar=1&LAN=DE A1 C. De Santi A1 M. Buffolo A1 I. Rossetto A1 T. Bordignon A1 E. Brusaterra A1 A. Caria A1 F. Chiocchetta A1 D. Favero A1 M. Fregolent A1 F. Masin A1 N. Modolo A1 A. Nardo A1 F. Piva A1 F. Rampazzo A1 C. Sharma A1 N. Trivellin A1 G. Zhan A1 M. Meneghini A1 E. Zanoni A1 G. Meneghesso PB Elsevier YR 2021 K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF http://www.sciencedirect.com/science/article/pii/S2772671121000176 LK http://dx.doi.org/https://doi.org/10.1016/j.prime.2021.100018 DO https://doi.org/10.1016/j.prime.2021.100018 SF ELIB - SuUB Bremen
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