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1 Ergebnisse
1
High-Breakdown P-Channel GaN MOS-HFETs With Al 2 O 3 -Diele..:
Jian-Hong Ke
;
Ching-Sung Lee
;
Yu-Xuan Li
.
https://ieeexplore.ieee.org/document/10182302/. , 2023
Link:
https://doi.org/10.1109/JEDS.2023.3294911
RT Journal T1
High-Breakdown P-Channel GaN MOS-HFETs With Al 2 O 3 -Dielectric and Drain Field-Plate
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:8bf1891360e8421eb672a4748a8a7521&Exemplar=1&LAN=DE A1 Jian-Hong Ke A1 Ching-Sung Lee A1 Yu-Xuan Li A1 Wei-Chou Hsu PB IEEE YR 2023 K1 P-channel K1 GaN K1 MOS-HFET K1 non-vacuum ultrasonic spray pyrolysis deposition K1 Al₂O₃ K1 drain field-plate K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10182302/ LK http://dx.doi.org/https://doi.org/10.1109/JEDS.2023.3294911 DO https://doi.org/10.1109/JEDS.2023.3294911 SF ELIB - SuUB Bremen
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