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1 Ergebnisse
1
Fabric Defect Detection Using Salience Metric for Color Dis..:
Kaibing Zhang
;
Yadi Yan
;
Pengfei Li
...
https://ieeexplore.ieee.org/document/8453016/. , 2018
Link:
https://doi.org/10.1109/ACCESS.2018.2868059
RT Journal T1
Fabric Defect Detection Using Salience Metric for Color Dissimilarity and Positional Aggregation
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:90f43a6bbebc42c3a3fce204dc7d9ab2&Exemplar=1&LAN=DE A1 Kaibing Zhang A1 Yadi Yan A1 Pengfei Li A1 Junfeng Jing A1 Xiuping Liu A1 Zhen Wang PB IEEE YR 2018 K1 Color dissimilarity K1 defect map K1 fabric defect detection (FDD) K1 K-nearest neighbor (KNN) K1 multi-scale K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/8453016/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2018.2868059 DO https://doi.org/10.1109/ACCESS.2018.2868059 SF ELIB - SuUB Bremen
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