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1 Ergebnisse
1
Improving the High-Temperature Gate Bias Instabilities by a..:
Catherine Langpoklakpam
;
An-Chen Liu
;
Neng-Jie You
...
https://www.mdpi.com/2072-666X/14/3/576. , 2023
Link:
https://doi.org/10.3390/mi14030576
RT Journal T1
Improving the High-Temperature Gate Bias Instabilities by a Low Thermal Budget Gate-First Process in p-GaN Gate HEMTs
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:93338f7dd6d141c7b2dd805a523717ef&Exemplar=1&LAN=DE A1 Catherine Langpoklakpam A1 An-Chen Liu A1 Neng-Jie You A1 Ming-Hsuan Kao A1 Wen-Hsien Huang A1 Chang-Hong Shen A1 Jerry Tzou A1 Hao-Chung Kuo A1 Jia-Min Shieh PB MDPI AG YR 2023 K1 low thermal budget gate first process K1 ohmic contact K1 HTGB K1 gallium nitride K1 power device K1 Mechanical engineering and machinery K1 TJ1-1570 JF https://www.mdpi.com/2072-666X/14/3/576 LK http://dx.doi.org/https://doi.org/10.3390/mi14030576 DO https://doi.org/10.3390/mi14030576 SF ELIB - SuUB Bremen
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