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1 Ergebnisse
1
Surface Roughness-Induced Changes in Important Physical Fea..:
Chi-Lon Fern
;
Wen-Jen Liu
;
Yung-Huang Chang
...
https://www.mdpi.com/1996-1944/16/21/6989. , 2023
Link:
https://doi.org/10.3390/ma16216989
RT Journal T1
Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during Annealing
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:9d0504e8b4ca40a6b04d1d8f102579a3&Exemplar=1&LAN=DE A1 Chi-Lon Fern A1 Wen-Jen Liu A1 Yung-Huang Chang A1 Chia-Chin Chiang A1 Yuan-Tsung Chen A1 Pei-Xin Lu A1 Xuan-Ming Su A1 Shih-Hung Lin A1 Ko-Wei Lin PB MDPI AG YR 2023 K1 annealed Co 60 Fe 20 Sm 20 thin films K1 low-frequency alternating current magnetic susceptibility (χ ac ) K1 optimal resonance frequency (f res ) K1 surface energy K1 adhesion K1 nanoindentation K1 Technology K1 T K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 K1 Engineering (General). Civil engineering (General) K1 TA1-2040 K1 Microscopy K1 QH201-278.5 K1 Descriptive and experimental mechanics K1 QC120-168.85 JF https://www.mdpi.com/1996-1944/16/21/6989 LK http://dx.doi.org/https://doi.org/10.3390/ma16216989 DO https://doi.org/10.3390/ma16216989 SF ELIB - SuUB Bremen
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