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1 Ergebnisse
1
Modeling of 3D NAND Characteristics for Cross‐Temperature b..:
Kyeongrae Cho
;
Jeong-Sik Lee
;
Chanyang Park
...
https://doi.org/10.1002/aisy.202300400. , 2023
Link:
https://doi.org/10.1002/aisy.202300400
RT Journal T1
Modeling of 3D NAND Characteristics for Cross‐Temperature by Using Graph Neural Network and Its Application
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:a94ec992d5914f90a1f025fa622e6dd5&Exemplar=1&LAN=DE A1 Kyeongrae Cho A1 Jeong-Sik Lee A1 Chanyang Park A1 Hyeok Yun A1 Hyundong Jang A1 Seungjoon Eom A1 Min Sang Park A1 Hyun-Chul Choi A1 Rock-Hyun Baek PB Wiley YR 2023 K1 cross-temperature K1 graph neural networks K1 machine learning K1 neural networks K1 3D NAND flash K1 Computer engineering. Computer hardware K1 TK7885-7895 K1 Control engineering systems. Automatic machinery (General) K1 TJ212-225 JF https://doi.org/10.1002/aisy.202300400 LK http://dx.doi.org/https://doi.org/10.1002/aisy.202300400 DO https://doi.org/10.1002/aisy.202300400 SF ELIB - SuUB Bremen
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