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1 Ergebnisse
1
Low Cost Embedded Copper Mesh Based on Cracked Template for..:
Anton S. Voronin
;
Yurii V. Fadeev
;
Mstislav O. Makeev
...
https://www.mdpi.com/1996-1944/15/4/1449. , 2022
Link:
https://doi.org/10.3390/ma15041449
RT Journal T1
Low Cost Embedded Copper Mesh Based on Cracked Template for Highly Durability Transparent EMI Shielding Films
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:a9650899231140a8ad8ed923bfa390c3&Exemplar=1&LAN=DE A1 Anton S. Voronin A1 Yurii V. Fadeev A1 Mstislav O. Makeev A1 Pavel A. Mikhalev A1 Alexey S. Osipkov A1 Alexander S. Provatorov A1 Dmitriy S. Ryzhenko A1 Gleb Y. Yurkov A1 Mikhail M. Simunin A1 Darina V. Karpova A1 Anna V. Lukyanenko A1 Dieter Kokh A1 Dashi D. Bainov A1 Igor A. Tambasov A1 Sergey V. Nedelin A1 Nikita A. Zolotovsky A1 Stanislav V. Khartov PB MDPI AG YR 2022 K1 transparent electromagnetic interference (EMI) shielding films K1 cracked template K1 electroplating K1 photocurable resin K1 embedded mesh K1 durability K1 Technology K1 T K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 K1 Engineering (General). Civil engineering (General) K1 TA1-2040 K1 Microscopy K1 QH201-278.5 K1 Descriptive and experimental mechanics K1 QC120-168.85 JF https://www.mdpi.com/1996-1944/15/4/1449 LK http://dx.doi.org/https://doi.org/10.3390/ma15041449 DO https://doi.org/10.3390/ma15041449 SF ELIB - SuUB Bremen
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