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1 Ergebnisse
1
Lifetime Prediction of Current-and Temperature-Induced Degr..:
Alexander Herzog
;
Simon Benkner
;
Babak Zandi
...
https://ieeexplore.ieee.org/document/10054008/. , 2023
Link:
https://doi.org/10.1109/ACCESS.2023.3249478
RT Journal T1
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:ab768cbf2079407582a02b8a143e721b&Exemplar=1&LAN=DE A1 Alexander Herzog A1 Simon Benkner A1 Babak Zandi A1 Matteo Buffolo A1 Willem D. Van Driel A1 Matteo Meneghini A1 Tran Quoc Khanh PB IEEE YR 2023 K1 Light-emitting diode (LED) K1 degradation K1 UV-A K1 lifetime prediction K1 reliability K1 lens cracking K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10054008/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2023.3249478 DO https://doi.org/10.1109/ACCESS.2023.3249478 SF ELIB - SuUB Bremen
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