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A Compact Model for Interface-Type Self-Rectifying Resistiv..:
Jin-Woo Kim
;
Jun-Seok Beom
;
Hong-Sub Lee
.
https://ieeexplore.ieee.org/document/10379796/. , 2024
Link:
https://doi.org/10.1109/ACCESS.2024.3349463
RT Journal T1 <Title>A Compact Model for Interface-Type Self-Rectifying Resistive Memory With Experiment Verification</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:b491aca880394b65be0b7a9e60c48a1e&Exemplar=1&LAN=DE A1 Jin-Woo Kim A1 Jun-Seok Beom A1 Hong-Sub Lee A1 Nam-Seog Kim PB IEEE YR 2024 K1 Compact model K1 crossbar array K1 interface-type RRAM K1 multiply and accumulate (MAC) K1 nano-battery effect K1 parasitic capacitance K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10379796/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2024.3349463 DO https://doi.org/10.1109/ACCESS.2024.3349463 SF ELIB - SuUB Bremen
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