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Deep-level transient spectroscopy of the charged defects in..:

A.A. Vasilev ; D.S. Saranin ; P.A. Gostishchev...
http://www.sciencedirect.com/science/article/pii/S2590147822000821.  , 2022
Link: https://doi.org/10.1016/j.omx.2022.100218