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1 Ergebnisse
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An Analytical Breakdown Model for the SOI LDMOS With Arbitr..:
Kemeng Yang
;
Yufeng Guo
;
Jun Zhang
...
https://ieeexplore.ieee.org/document/8941064/. , 2020
Link:
https://doi.org/10.1109/JEDS.2019.2962007
RT Journal T1
An Analytical Breakdown Model for the SOI LDMOS With Arbitrary Drift Doping Profile by Using Effective Substrate Voltage Method
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:b91e8bb9207345b2948c84dde6a72063&Exemplar=1&LAN=DE A1 Kemeng Yang A1 Yufeng Guo A1 Jun Zhang A1 Jiafei Yao A1 Man Li A1 Ling Du A1 Xiaoming Huang PB IEEE YR 2020 K1 LDMOS K1 arbitrary doping profile K1 electric field K1 breakdown voltage (BV) K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/8941064/ LK http://dx.doi.org/https://doi.org/10.1109/JEDS.2019.2962007 DO https://doi.org/10.1109/JEDS.2019.2962007 SF ELIB - SuUB Bremen
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