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1 Ergebnisse
1
Combined Effect of TID Radiation and Electrical Stress on N..:
Yanrong Cao
;
Min Wang
;
Xuefeng Zheng
...
https://www.mdpi.com/2072-666X/13/11/1860. , 2022
Link:
https://doi.org/10.3390/mi13111860
RT Journal T1
Combined Effect of TID Radiation and Electrical Stress on NMOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:c00d40668dee42e6933d11ee525c134b&Exemplar=1&LAN=DE A1 Yanrong Cao A1 Min Wang A1 Xuefeng Zheng A1 Enxia Zhang A1 Ling Lv A1 Liang Wang A1 Maodan Ma A1 Hanghang Lv A1 Zhiheng Wang A1 Yongkun Wang A1 Wenchao Tian A1 Xiaohua Ma A1 Yue Hao PB MDPI AG YR 2022 K1 TID K1 electrical stress K1 combined effect K1 NMOSFETs K1 Mechanical engineering and machinery K1 TJ1-1570 JF https://www.mdpi.com/2072-666X/13/11/1860 LK http://dx.doi.org/https://doi.org/10.3390/mi13111860 DO https://doi.org/10.3390/mi13111860 SF ELIB - SuUB Bremen
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