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1 Ergebnisse
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Super-resolution fluorescence microscopy on E-beam resist f..:
Sukjong Bae
;
Flip de Jong
;
Rik Nuyts
...
http://www.sciencedirect.com/science/article/pii/S2590007223000102. , 2023
Link:
https://doi.org/10.1016/j.mne.2023.100180
RT Journal T1 <Title>Super-resolution fluorescence microscopy on E-beam resist film during electron beam exposure for mask patterning process</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:c0251609fd034b55b5cde3fe0458f653&Exemplar=1&LAN=DE A1 Sukjong Bae A1 Flip de Jong A1 Rik Nuyts A1 Rahul Sasikumar A1 Haifeng Yuan A1 Seongjune Min A1 Jin Choi A1 Sanghee Lee A1 Joonsoo Park A1 Johan Hofkens PB Elsevier YR 2023 K1 E-beam lithography K1 Photomask K1 Super resolution fluorescence microscopy K1 E-beam resist K1 Electronics K1 TK7800-8360 K1 Technology (General) K1 T1-995 JF http://www.sciencedirect.com/science/article/pii/S2590007223000102 LK http://dx.doi.org/https://doi.org/10.1016/j.mne.2023.100180 DO https://doi.org/10.1016/j.mne.2023.100180 SF ELIB - SuUB Bremen
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