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1 Ergebnisse
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Contact-Less Integrity Verification of Microelectronics Usi..:
Junjun Huan
;
Peyman Dehghanzadeh
;
Soumyajit Mandal
.
https://ieeexplore.ieee.org/document/10197409/. , 2023
Link:
https://doi.org/10.1109/ACCESS.2023.3300222
RT Journal T1
Contact-Less Integrity Verification of Microelectronics Using Near-Field EM Analysis
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:c446acb181804ecdbf68dc776e9f5d9c&Exemplar=1&LAN=DE A1 Junjun Huan A1 Peyman Dehghanzadeh A1 Soumyajit Mandal A1 Swarup Bhunia PB IEEE YR 2023 K1 Near-field electromagnetic emission K1 hardware integrity verification K1 FPGA fabric K1 system on chip K1 linear-feedback shift register K1 counterfeit electronics K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10197409/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2023.3300222 DO https://doi.org/10.1109/ACCESS.2023.3300222 SF ELIB - SuUB Bremen
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