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ARMScope – the versatile platform for scanning probe micros..:
Świadkowski Bartosz
;
Piasecki Tomasz
;
Rudek Maciej
...
http://journals.pan.pl/dlibra/publication/131711/edition/115042/content. , 2020
Link:
https://doi.org/10.24425/mms.2020.131711
RT Journal T1
ARMScope – the versatile platform for scanning probe microscopy systems
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:c722ce4fa6394424ac7d84d8eb1b123c&Exemplar=1&LAN=DE A1 Świadkowski Bartosz A1 Piasecki Tomasz A1 Rudek Maciej A1 Świątkowski Michał A1 Gajewski Krzysztof A1 Majstrzyk Wojciech A1 Babij Michał A1 Dzierka Andrzej A1 Gotszalk Teodor PB Polish Academy of Sciences YR 2020 K1 scanning probe microscopy K1 afm K1 kelvin probe force microscopy K1 scanning tunnelling microscopy K1 Technology K1 T JF http://journals.pan.pl/dlibra/publication/131711/edition/115042/content LK http://dx.doi.org/https://doi.org/10.24425/mms.2020.131711 DO https://doi.org/10.24425/mms.2020.131711 SF ELIB - SuUB Bremen
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