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1 Ergebnisse
1
Drain-Induced-Barrier-Lowing-Like Effect Induced by Oxygen-..:
Chung-I. Yang
;
Ting-Chang Chang
;
Po-Yung Liao
...
https://ieeexplore.ieee.org/document/8360776/. , 2018
Link:
https://doi.org/10.1109/JEDS.2018.2837682
RT Journal T1
Drain-Induced-Barrier-Lowing-Like Effect Induced by Oxygen-Vacancy in Scaling-Down via-Contact Type Amorphous InGaZnO Thin-Film Transistors
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:d2f113e1ff8d46f38ccfc5144977f326&Exemplar=1&LAN=DE A1 Chung-I. Yang A1 Ting-Chang Chang A1 Po-Yung Liao A1 Li-Hui Chen A1 Bo-Wei Chen A1 Wu-Ching Chou A1 Guan-Fu Chen A1 Sung-Chun Lin A1 Cheng-Yen Yeh A1 Cheng-Ming Tsai A1 Ming-Chang Yu A1 Shengdong Zhang PB IEEE YR 2018 K1 Bottom gate TFTs K1 indium gallium zinc oxide (IGZO) K1 oxygen vacancy K1 drain induced barrier lowing (DIBL) K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/8360776/ LK http://dx.doi.org/https://doi.org/10.1109/JEDS.2018.2837682 DO https://doi.org/10.1109/JEDS.2018.2837682 SF ELIB - SuUB Bremen
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