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1 Ergebnisse
1
Robust Active Contour Model Using Patch-Based Signed Pressu..:
Hongli Lv
;
Fangjian Zhang
;
Renfang Wang
https://ieeexplore.ieee.org/document/9316288/. , 2021
Link:
https://doi.org/10.1109/ACCESS.2021.3049513
RT Journal T1
Robust Active Contour Model Using Patch-Based Signed Pressure Force and Optimized Fractional-Order Edge
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:d380f35b2a6e4ba99dc0aa631dd9a664&Exemplar=1&LAN=DE A1 Hongli Lv A1 Fangjian Zhang A1 Renfang Wang PB IEEE YR 2021 K1 Active contour K1 image segmentation K1 Jensen-Shannon divergence K1 fractional-order Gaussian derivatives K1 patch-based external force K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/9316288/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2021.3049513 DO https://doi.org/10.1109/ACCESS.2021.3049513 SF ELIB - SuUB Bremen
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