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1 Ergebnisse
1
Effect of Source Field Plate Cracks on the Electrical Perfo..:
Ye-Nan Bie
;
Cheng-Lin Du
;
Xiao-Long Cai
...
https://www.mdpi.com/2073-4352/12/9/1195. , 2022
Link:
https://doi.org/10.3390/cryst12091195
RT Journal T1
Effect of Source Field Plate Cracks on the Electrical Performance of AlGaN/GaN HEMT Devices
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:da99d0a206f64ddcb6d310f5fc0e6110&Exemplar=1&LAN=DE A1 Ye-Nan Bie A1 Cheng-Lin Du A1 Xiao-Long Cai A1 Ran Ye A1 Hai-Jun Liu A1 Yu Zhang A1 Xiang-Yang Duan A1 Jie-Jie Zhu PB MDPI AG YR 2022 K1 AlGaN/GaN HEMTs K1 source field plate cracks K1 GaN TCAD modeling K1 electrical performance K1 Crystallography K1 QD901-999 JF https://www.mdpi.com/2073-4352/12/9/1195 LK http://dx.doi.org/https://doi.org/10.3390/cryst12091195 DO https://doi.org/10.3390/cryst12091195 SF ELIB - SuUB Bremen
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