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1 Ergebnisse
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Random and Systematic Variation in Nanoscale Hf0.5Zr0.5O2 F..:
Sourav De
;
Md. Aftab Baig
;
Bo-Han Qiu
...
https://www.frontiersin.org/articles/10.3389/fnano.2021.826232/full. , 2022
Link:
https://doi.org/10.3389/fnano.2021.826232
RT Journal T1 <Title>Random and Systematic Variation in Nanoscale Hf0.5Zr0.5O2 Ferroelectric FinFETs: Physical Origin and Neuromorphic Circuit Implications</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:e00d78ed90be40e29e7c428dbb80f3f5&Exemplar=1&LAN=DE A1 Sourav De A1 Md. Aftab Baig A1 Bo-Han Qiu A1 Franz Müller A1 Hoang-Hiep Le A1 Maximilian Lederer A1 Thomas Kämpfe A1 Tarek Ali A1 Po-Jung Sung A1 Chun-Jung Su A1 Yao-Jen Lee A1 Darsen D. Lu PB Frontiers Media S.A. YR 2022 K1 hafnium oxide K1 ferroelectric finFET K1 non-volatile memory K1 variation K1 neural networks K1 Chemical technology K1 TP1-1185 JF https://www.frontiersin.org/articles/10.3389/fnano.2021.826232/full LK http://dx.doi.org/https://doi.org/10.3389/fnano.2021.826232 DO https://doi.org/10.3389/fnano.2021.826232 SF ELIB - SuUB Bremen
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