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1 Ergebnisse
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Tapered Cross Section Photoelectron Spectroscopy Provides I..:
Clément Maheu
;
Mohammad Amin Zare Pour
;
Iban Damestoy
...
https://doi.org/10.1002/admi.202201648. , 2023
Link:
https://doi.org/10.1002/admi.202201648
RT Journal T1
Tapered Cross Section Photoelectron Spectroscopy Provides Insights into the Buried Interfaces of III‐V Semiconductor Devices
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:e90ce90e48c4478fb77b29c441ec377a&Exemplar=1&LAN=DE A1 Clément Maheu A1 Mohammad Amin Zare Pour A1 Iban Damestoy A1 David Ostheimer A1 Maximilian Mellin A1 Dominik C. Moritz A1 Agnieszka Paszuk A1 Wolfram Jaegermann A1 Thomas Mayer A1 Thomas Hannappel A1 Jan P. Hofmann PB Wiley-VCH YR 2023 K1 III‐V semiconductors K1 buried interfaces K1 energetic alignment K1 photoelectron spectroscopy K1 tapered cross section K1 Physics K1 QC1-999 K1 Technology K1 T JF https://doi.org/10.1002/admi.202201648 LK http://dx.doi.org/https://doi.org/10.1002/admi.202201648 DO https://doi.org/10.1002/admi.202201648 SF ELIB - SuUB Bremen
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