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1 Ergebnisse
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Direct Visualization of Charge Migration in Bilayer Tantalu..:
Matthew Flynn‐Hepford
;
John Lasseter
;
Ivan Kravchenko
...
https://doi.org/10.1002/aelm.202300589. , 2024
Link:
https://doi.org/10.1002/aelm.202300589
RT Journal T1
Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:e9aecfc4b6894036a6c6ab5d8b3dae66&Exemplar=1&LAN=DE A1 Matthew Flynn‐Hepford A1 John Lasseter A1 Ivan Kravchenko A1 Steven Randolph A1 Jong Keum A1 Bobby G. Sumpter A1 Stephen Jesse A1 Petro Maksymovych A1 A. Alec Talin A1 Matthew J. Marinella A1 Philip D. Rack A1 Anton V. Ievlev A1 Olga S. Ovchinnikova PB Wiley-VCH YR 2024 K1 memristors K1 ReRAM K1 tantalum oxide K1 Electric apparatus and materials. Electric circuits. Electric networks K1 TK452-454.4 K1 Physics K1 QC1-999 JF https://doi.org/10.1002/aelm.202300589 LK http://dx.doi.org/https://doi.org/10.1002/aelm.202300589 DO https://doi.org/10.1002/aelm.202300589 SF ELIB - SuUB Bremen
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