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Calibration-free real-time organic film thickness monitorin..:
Junghwan Park
;
Yong Suk Choi
;
Junhyuck Kim
...
http://www.sciencedirect.com/science/article/pii/S1738573320308809. , 2021
Link:
https://doi.org/10.1016/j.net.2020.09.018
RT Journal T1 <Title>Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:ecde019fd94145ac8892ab07144f8e3a&Exemplar=1&LAN=DE A1 Junghwan Park A1 Yong Suk Choi A1 Junhyuck Kim A1 Jeongmook Lee A1 Tae Jun Kim A1 Young-Sang Youn A1 Sang Ho Lim A1 Jong-Yun Kim PB Elsevier YR 2021 K1 Organic film K1 X-ray fluorescence K1 Compton scattering K1 X-ray radiation K1 Thickness K1 Nuclear engineering. Atomic power K1 TK9001-9401 JF http://www.sciencedirect.com/science/article/pii/S1738573320308809 LK http://dx.doi.org/https://doi.org/10.1016/j.net.2020.09.018 DO https://doi.org/10.1016/j.net.2020.09.018 SF ELIB - SuUB Bremen
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