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1 Ergebnisse
1
Review of Memory RAS for Data Centers:
Jiseong Lee
;
Min Joon Kim
;
Woo-Seop Kim
.
https://ieeexplore.ieee.org/document/10308581/. , 2023
Link:
https://doi.org/10.1109/ACCESS.2023.3329984
RT Journal T1 <Title>Review of Memory RAS for Data Centers</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:f3c8bcd72ca64c5f88a4458e208e9f23&Exemplar=1&LAN=DE A1 Jiseong Lee A1 Min Joon Kim A1 Woo-Seop Kim A1 Yong Sin Kim PB IEEE YR 2023 K1 Correctable error (CE) K1 error correction code (ECC) K1 memory reliability K1 availability K1 serviceability (RAS) K1 uncorrectable error (UE) K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/10308581/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2023.3329984 DO https://doi.org/10.1109/ACCESS.2023.3329984 SF ELIB - SuUB Bremen
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